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TLP-12010A
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High Voltage 50 Ω Pulse Generator
Features
- High pulse output current up to ±120 A (short circuit)
- Ultra-fast 50 Ω high voltage pulse output with typical 300 ps rise time
- Wafer, package and system level TLP and HMM testing
- 180 kW peak output power into 50 Ω load
- Built-in HMM pulse up to ±32 kV in 50 Ω-configuration
- High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)
- 6 digital programmable pulse rise times out of: 300 ps to 50 ns (optional)
- 1 built-in pulse width: 100 ns
- Optional external pulse width extensions from 5 ns to 500 ns using the external pulse width extender TLP-12012A6
- Built-in pulse reflection suppression
- Fast measurement time, typically less than 0.2 s per pulse including one-point DC measurement between pulses
- Efficient software for system control and waveform data management
- The software can control automatic probers for fast measurements of complete wafers
- Integrated interlock safety shut-down
- Industrial isolated and EMI/ESD protected USB control interface
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TLP-12010C
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120 A High Voltage 50 Ω Pulse Generator
Features
- High pulse output current up to 120 A (short circuit)
- Ultra-fast 50 Ω high voltage pulse output with typical rise time 100 ps (0 A to 40 A) and 300 ps in high-current mode (0 A to 120 A)
- Wafer, package and system level TLP, VF-TLP and HMM testing
- Up to 180 kW peak output power into 50 Ω load
- Built-in HMM pulse up to ±32 kV in 50 Ω-configuration
- High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)
- 6 USB programmable pulse rise times: 100 ps to 50 ns (custom selectable)
- 8 (optional 9) programmable pulse widths: 0.5 ns (optional), 1 ns to 100 ns (0 A to 40 A), 1 built-in pulse width: 100 ns (>40 A)
- The optional pulse width extender TLP-3011C enables pulse width up to 1.6 µs in 68 GPIB programmable steps (0 A to 40 A)
- Optional external pulse width extensions from 5 ns to 500 ns (>40 A to 120 A)using the external pulse width extender TLP-12012A6
- Built-in pulse reflection suppression
- Fast measurement time, typically less than 0.2 s per pulse including one-point DC measurement between pulses
- Efficient sofware for system control and waveform data management
- The sofware can control automatic probers for fast measurements of complete wafers
- Combines TLP-12010A and TLP-4010C into one system
- Can be operated together with TLP-12012A6 and TLP-3011C pulse width extenders
- Integrated interlock safety shut-down
- Industrial isolated and EMI/ESD protected USB control interface
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AutomatedTestSystem ATS-8000A
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The ATS-8000A test system is a fully automated 2-pin probing solution for HBM, TLP ,HMM and CC-TLP on package-and waferlevel. Future extension for CDM is optional.
The vacuum rotary stage can be configured for any package shape, any package size and wafers.
The probe force sensors ensures maximum probe tip life time and avoid job interruption.
The 3-axis motion systems and rotary stage are designed for ultra-fast speed to maximize throughput.
The user interface and data management is based on HPPI standard software.
Easy to use, rugged high quality components, high throughput.
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CC-TLP
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The CC-TLP-50-A1 probearm is used for CC-TLP measurements
in order to investigate the CDM performance
of the device under test [1], [2], [3], [4], [5]. For
that purpose the TLP pulse has to have a pulse width
less than 1 ns and a rise time of about typical 100 ps.
DUT voltage and current have to be measured using a
vf-TLP setup.
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Company Profile
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High Power Pulse Instruments GmbH (HPPI) is a supplier of ESD
measurement equipment based on advanced Transmission Line Pulse
(TLP) techniques.
Our products enable the characterization of semiconductor devices and
circuits in the pulsed high current and high voltage time domain.
The development of our systems has profited largely from the knowledge
gained over 15 years in the development of semiconductor devices, i
ntegrated high speed and radio frequency circuits and ESD protection
techniques for the semiconductor industry.
Our products combine standard TLP, very fast TLP and Human Metal
Model (HMM) in a single test system to cover most of today's ESD characterization
needs.
What is TLP testing? 아래 데이터 시트를 클릭 해주세요.
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80A High Current TLP/HMM Test System TLP-8010A
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Wafer, package and system level TLP/HMM testing
Fast 50 Ω high voltage pulse output with typically 300 ps rise time
Up to 90 kW peak output power into 50 Ω load
Built-in HMM pulse up to ±16 kV with 100 Ω configuration
High pulse output current up to ±80 A (short circuit) with 6 dB reflection suppression
6 GPIB programmable pulse rise times: 300 ps to 50 ns
1 built-in pulse width: 2 ns plus 100 ns with one external charge line cable
Optional external pulse width extensions from 2 ns to 500 ns using the pulse width extender TLP-8012A5
Fast measurement time, typically 0.5 s per pulse including one-point DC measurement between pulses
Reverse recovery measurement capabilities in the range of ns up to µs
High-Voltage DMOS SOA measurements
Efficient MATLAB?-based software for system control and waveform data management
The software can control automatic probers for fast measurements of complete wafers
High performance and high quality components
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Pulse Width Extender TLP-8012A5
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Features of the System
- Pulse width extender for the 80A high current TLP/HMM
test system TLP-8010A
- 6 manual selectable pulse width: 5, 10, 50, 100,
200 and 500ns
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80A High Current TLP/VF-TLP/HMM Test System TLP-8010C
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Wafer, package and system level TLP/VF-TLP/HMM testing
Combines TLP-8010A and TLP-3010C into one system
Can be operated together with TLP-8012A5 and TLP-3011C
pulse width extenders
Ultra fast 50 Ω high voltage pulse output with typical rise time
100 ps (0-30 A) and 300 ps (> 30 A)
Up to 90 kW peak output power into 50 Ω load
Built-in HMM pulse up to ±16 kV with 100 Ω configuration
High pulse output current up to ±80 A (short circuit) with
6 dB reflection suppression
High speed 50 Ω trigger output for oscilloscopes
(synchronous to high voltage pulse output)
6 GPIB programmable pulse rise times: 100 ps to 50 ns
8 programmable pulse widths: 1 ns to 100 ns (0-30 A),
1 built-in pulse width: 2 ns (> 30 A)
The optional pulse width extender TLP-3011C enables pulse
width up to 1.6 µs in 68 GPIB programmable steps (0-30 A)
Optional external pulse width extensions from 2 ns to 500 ns
(> 30 A) using the external pulse width extender TLP-8012A5
Fast measurement time, typically 0.5 s per pulse including one-point
DC measurement between pulses
Reverse recovery measurement capabilities in the range of ns up to µs
High-Voltage DMOS SOA measurements
Efficient MATLAB?-based software for system control and waveform data management
The software can control automatic probers for fast measurements of complete wafers
High performance and high quality components
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30A TLP/VF-TLP/HMM Test System TLP-3010C/3011C
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Pulse System TLP-3010C/3011C for the following applications fields:
- ESD robustness characterization on wafer-, chip- and board-level by TLP/vf-TLP/HMM pulse types
- Safe-Operating-Area (SOA) measurements of active and passive devices from 1 ns to 1.6 µs pulse width
- Reverse and forward recovery measurements of diodes from 200 ps to 1 µs
- Breakdown and turn on/off characteristics of devices
- Measurement of the impulse response
Features of the System
- Wafer and system level TLP/VF-TLP/HMM test system
- Ultra fast 50 Ω pulse output with 100 ps rise time
- Built-in HMM (IEC 61000-4-2) pulse up to ±8 kV
- High pulse output current up to ±30 A
- 6 programmable pulse rise-times: 100 ps to 45 ns
- 8 programmable pulse widths: 1 ns to 100 ns
- Optional pulse width extender increases pulse width up to 1.6 µs in 68 GPIB programmable steps
- Fast measurement time, typically 0.5 s per pulse including one-point DC measurement between pulses
- Efficient MATLAB?-based software for system control and waveform data management
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CMTI-8010C
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CMTI-8010C
High Voltage50 Ω Pulse Generator for CMTI Application
The CMTI-8010C isa high voltage 50 Ω pulse generator for static and dynamic common mode transferinterference (CMTI) evaluations of digital isolators according IEC-60747-5-5and IEC-60747-17.
Features
- High voltage 50 Ω pulse generator for static and dynamic common mode transfer interference (CMTI) evaluations of digital isolators according IEC-60747-5-5 and IEC-60747-17
- Two digital programmable operation modes:
- Mode A: high voltage mode at minimum 0.3 ns pulse rise time
- Mode B: medium voltage mode at minimum 100 ps pulse rise time
- CMTI slew rate:
- up to 10000 V/ns at 3 kV open load output voltage and 0.3 ns rise time (mode A)
- up to 20000 V/ns at 2 kV open load output voltage and 100 ps rise time (mode B)
- 80 kW output power into 50 Ω load (mode A)
- 8 programmable pulse rise times out of: 50 ns, 20 ns, 10 ns, 7 ns, 5 ns, 3.5 ns, 2 ns, 1 ns, 0.6 ns, 0.3 ns, 200 ps, 100 ps (other values on request)
- Optional manual external pulse width extensions from 5 ns to 500 ns (up to 2 µs on request) using the external pulse width extender TLP-8012A5 in mode A up to 3 kV open load output voltage.
- Optional automatic programmable pulse width extensions from 125 ns to 1600 ns (up to 2 µs on request) in 25 ns step size using the external pulse width extender TLP-3011C in mode B up to 2 kV open load output voltage.
- High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)
- Built-in pulse reflection suppression
- Fast pulse repetition rate, typically 100 ms per pulse
- Application programming interface (API): software macros to control pulse generator in standalone operation
- Integrated interlock safety shut-down needed for pulse widths beyond 500 ns
- Industrial isolated and EMI/ESD protected USB control interface
- Two years warranty on the total system
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Precision Micromanipulator Kit for TLP/VF-TLP Wafer-Level Measurements PHD-3001A
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Pulse force and pulse sense RF probing solution for TLP/VF-TLP/HMM on-wafer measurements
High peak current capability 80 A (100 ns)
DC - 7 GHz bandwidth
Isolated probe-head ground shield for high pulse sense common mode signal rejection
True coaxial high-resolution 80:1 rotary probe-head for accurate probe tip adjustment
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Portable Wafer Probe Station PS-5026A
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Portable manual wafer probe station
Electrically isolated chuck with vacuum interface and wafer backside potential connector
80x trinocular stereo zoom microscope
Ultra long-life 20000 lx white LED ring light
High reliability
Low cost
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